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EDS
TEM 用 EDS

AZtec は TEM および STEM における EDS アプリケーションのための究極の材料特性評価システムを実現しています。AZtec は、分析業務の最前線における作業にとって最高のツールです。

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EDS for TEM Explained

This document gives an introduction to EDS applications in the Transmission Electron Microscope (TEM).

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AZtecTEM

This brochure shows why AZtecTEM is the most powerful solution for EDS on the TEM.

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Simultaneous EDS and EELS in the TEM

Simultaneous acquisition of EDS and EELS is a powerful tool for materials analysis

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Semiconductor Mapping in the TEM - Solving peak overlaps in real-time

Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition.

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アプリケーションノート

Simultaneous EDS and EELS in the TEM

Simultaneous acquisition of EDS and EELS is a powerful tool for materials analysis

Download
Semiconductor Mapping in the TEM - Solving peak overlaps in real-time

Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition.

Download

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